Advanced light sources generate intense light pulses many times per second, requiring scientists to exchange samples at high rates in many experiments. At frequencies of 10 Hz, automation is needed to place targets or to change sample position so that they can be irradiated by the light. High spatial precision is a further requirement for this technique. Technologies developed through HIREP use several automated, standardized methods to enable scientists to make more efficient use of the advanced light source facilities. These technologies also support complementary experiments at different advanced light sources.

Standard sample infrastructure

HIREP scientists developed two sets of standard sample frames for use at various advanced light source instruments. One is a frame for biological samples, with evenly spaced conical grooves that act like wells into which cryogenically frozen biological samples are delivered. The second frame holds solid samples such as foils, possibly carrying deposited thin films for investigation. HIREP’s special software uses a form of artificial intelligence to identify areas of interest on these foils for the experiment. A sample scanner and a rotating stand automatically and precisely align the foils in the frame relative to the pump or probe beams and move the samples to match a 10 Hz repetition rate.

Image:The HIREP standardised sample frame holds solid sample foils for experiments performed at advanced light sources. The frame is sturdy enough to be reused multiple times. The foils are attached to the frame where the three rectangular holes can be seen. A barcode on the frame (seen to the bottom left of where the foils are attached) links the information about sample targeting to the automated alignment system, helping scientists do research at a high repetition rate and handle potentially thousands of samples in one experiment. (Credit: European XFEL)

Support for complementary experiments

The sample technologies developed by HIREP enable complementary experiments at different advanced light
sources. The setup can be adapted to any advanced light source instrument. Every frame has a specific barcode
attached to it that is used for associating the frame with a specific sample and allows for linking the information about that specific frame, stored in the software, with the actual measurement. A central database acts as a repository for data collected using the HIREP setup, allowing data to be called up by users regardless of what institute they are currently doing work at. Comparisons of results at different instruments are then easier to perform, enabling complementary experiments and allowing users to learn more from experiments at several facilities.

Image: Target identification hardware and software helps scientists find potential areas of interest on the sample. A microscope (left) scans the sample frame and uses artificial intelligence to identify regions of interest to be targeted. The location of these spots is aligned with the frame (right) and this information is communicated to the sample scanner via the barcode on the frame. The scanner then automatically aligns the spots of interest with the X-ray or laser beam. (Credit: European XFEL)

HIREP Deliverables

Deliverable 6.1 - Design report for standard sample holder (Report on Standard sample holder) / Submitted 31 October 2016

Deliverable 6.2 - Sample positioning device (Prototype of sample positioning device with high precision UHV scanning stages is built and tested. The technology is available for all institutes to be integrated in their instrumentation) / Submitted 31 March 2017

Deliverable 6.3 - Beta version of sample identification software (Beta test version of sample identification software is available to be used in all institutes) / Submitted 31 March 2017

Deliverable 6.4 - EMP-compatible stages (Report about the effects of EMP on Motor stages) / Submitted 29 September 2017

Deliverable 6.5 - Sample holder with cooling and heating capacity (Prototype sample holder available) / Submitted 29 March 2018

Deliverable 6.6 - UHV microscope (Prototype of ultra-high vacuum microscope available) / Submitted 17 April 2018

Deliverable 6.7 - Automatic sample identification software (Prototype Version of sample identification Software available)

Deliverable 6.8 - Integration of sample stages with microscope (Prototype of sample stages with integrated microscope available)